International Short Course on Advanced High-resolution 3D Imaging

Target group

This Short Course aims at providing a thorough insight in the working principles, theoretical background and technical aspects of advanced radiation-based 3D imaging techniques related to X-ray µCT, as well as providing an understanding of the differences, advantages and limitations of different techniques.  
The course targets PhD students that specialize in 3D imaging techniques and want to obtain deeper insight in related research fields. Nonetheless, the course is open to post-doctoral researchers as well.
In the Ghent University Doctoral Schools program, this course is complementary to the course “High-resolution X-ray tomography: a guide to image acquisition, processing and visualization”, organized by UGCT in January 2017.  Attendance of this earlier course is not a prerequisite towards enjoying this course.


- Prof. dr. ir. Matthieu N. Boone
- Prof. dr. Veerle Cnudde
- Prof. dr. ir. Jan Van den Bulcke
- dr. ir. Jan Aelterman
- Amélie De Muynck

Content of the course

The course intends to give to the attendees a solid background of different advanced 3D imaging techniques which are often complementary to X-ray μCT. Apart from technical talks on ptychography, grating-based phase contrast, synchrotron X-ray imaging, neutron imaging and diffraction-based imaging, the course will also include talks about data processing, going more into detail about advanced reconstruction methods and data analysis.

Dates and Venue

  • Dates: 17-18-19 January 2018
  • Location: Department of Physics and Astronomy; Proeftuinstraat 86, 9000 Gent


  • Day 1:  Wednesday 17 January 2018 from 12:00 - 19:00

After lunch and a welcome from the organizers, an advanced lecture on lab-based imaging is planned, covering specific topics such as detector lag, X-ray tube properties, etc. After a coffee break, the mathematics behind tomographic reconstruction will be elaborated, as variations on these methods will be shown in the techniques presented later on. After this, there will be a poster session with ice breaker reception. All attendees will have the opportunity to bring a poster presenting their research topic, providing a good opportunity to get to know each other. A prize will be given to the best poster.

-    12:00 – 13:30 Registration and lunch
-    13:30 – 13:45 Introduction by organizers - Prof. M.N. Boone (UGent/UGCT, BE)
-    13:45 – 15:15 Advanced aspects of laboratory-based µCT - Prof. M.N. Boone (UGent/UGCT, BE)
-        15:15 – 15:30 Coffee break
-    15:30 – 17:00 Mathematics of tomographic reconstruction - Prof. M. Defrise (VUB, BE)
-    17:00 – 19:00 Poster session + ice breaker reception. During the reception there will be the opportunity to visit the UGCT systems.

  • Day 2: Thursday 18 January 2018 from 9:00 - 17:45

On the second day, advanced imaging techniques will be elaborated by international experts in these research fields. The first lecture will be on synchrotron-based micro-CT and nano-CT imaging, and includes background information on the operation of a synchrotron. Additionally, more specific imaging techniques such as grating interferometry, 3D diffraction imaging and ptychography are discussed by experts in the field. We will end the day by a presentation on neutron imaging.

-    09:00 – 10:30 Synchrotron-based imaging - Prof. M. Stampanoni (PSI/ETHz, CH)
-        10:30 – 10:45 Coffee break + posters
-    10:45 – 12:15 Grating interferometry - Prof. M. Stampanoni (PSI/ETHz, CH)
       12:15 – 13:00 Lunch
-    13:00 – 14:30 3D Diffraction imaging - dr. E. Lauridsen (XNovo Technology, DK)
-        14:30 – 14:45 Coffee break + posters
-    14:45 – 16:15 Ptychography - dr. A. Diaz (PSI, CH)
-        16:15 – 16:30 Coffee break + posters
-    16:30 – 17:45 Neutron imaging - dr. A. Kaestner (PSI, CH)

  • Day 3: Friday 19 January 2018 from 9:00 - 15:00

The morning of the third day will be on the topic of spectroscopy. This includes a lecture on the hardware involved in spectroscopic transmission imaging, as well as a lecture on 3D X-ray fluorescence as an analytical imaging technique. In the afternoon, a lecture on the fundamentals of image analysis will be given.
After the closing, an optional short course on one of the best visualization and analysis toolkits on the market, VGStudio, will be organized. An additional registration (free of charge) is required for this workshop.

-    09:00 – 10:30 Spectroscopic detectors- dr. R. Ballabriga ( (CERN, CH)
-        10:30 – 10:45 Coffee break + posters
-    10:45 – 12:15 X-ray fluorescence - Prof. L. Vincze (UGent/XMI, BE)
       12:15 – 13:00 Lunch
-    13:00 – 14:30 Image analysis - dr. J. Aelterman (UGent/IPI, BE)
-    14:30 – 14:45 Closing - Prof. M. Boone (UGCT)
-        14:45 – 15:00 Coffee break
-    15:00 – 18:00 (optional) VGStudio tutorial - Volume Graphics


As this is a highly specialized coursed, we are very honored to welcome the following  international specialists:

- Prof. M. Stampanoni (ETHz / PSI, Switzerland) is the group leader of the X-ray Tomography group at the Swiss Light Source, hosting the TOMCAT beamline, and professor at the ETH in Zürich. He is one of the pioneers in grating-based X-ray imaging, both at synchrotron and lab-based systems.
- Dr. E. Lauridsen (Xnovo Technology, Denmark) is the founder of Xnovo Technologies, a company developing software for the analysis of diffraction data. Together with Zeiss XRadia, they have developed an add-on module a commercial μCT system for lab-based 3D diffraction imaging.
- Dr. A. Diaz (PSI, Switzerland) is beamline scientist at the cSAXS beamline of the Swiss Light Source, one of the leading beamlines for ptychographic imaging.
- Dr. A. Kaestner (PSI, Switzerland) is beamline responsible for the ICON (Imaging with COld Neutrons) beamline at the SINQ facility at PSI.
- Dr. R. Ballabriga (CERN, Switzerland) is one of the responsables for the chip designs of the consecutive Medipix chips developed at CERN, one of the most important families of hybrid pixel detectors.
- Prof. L. Vincze (UGent/XMI, Belgium) is the group leader of the X-ray Microspectroscopy and Imaging (XMI) group at UGent, and member of the Science Advisory Committee of the European Synchrotron Research Facility (ESRF). He is specialized in 2D and 3D μXRF imaging using both laboratory instrumentation and synchrotron facilities.
- Prof. M. Defrise (VUB, BE) is a lecturer at the Vrije Universiteit Brussels (VUB) and an internationally appreciated specialist in medical image reconstruction for different modalities including CT, PET and SPECT. His work has been recognized with several awards such as ‘Edward Hoffman Medical Imaging Scientist Award’ and the "Prijs De Boelpaepe".


If the course is fully booked you can send an e-mail to be added to the waiting list to mentioning your full name and student nr.

Number of participants

Maximum 40



Evaluation criteria (doctoral training programme)

100% active participation

Registration fee

Free of charge for members of the Doctoral Schools of Natural Sciences and (Bioscience) Engineering of Ghent University.
External participants pay 250€ registration fee. This fee includes the scientific program, lunch, coffee breaks and ice breaker reception.


For further information, please contact Prof. Matthieu Boone ()