Material and failure analysis

Several Characterization techniques exist to investigate the microstructure of a material or analyse failure post mortem.

Failure analysis or material characterization can be done via direct visualization, using techniques like light-optical microscopy (LOM), Scanning electron microscopy (SEM) or  transmission electron microscopy (TEM) depending on the required scale. 

Further insights into the composition of the material can be gained by in-depth characterization techniques like Energy dispersive X-ray detection (EDX), X-ray diffraction (XRD) or  Spark source optical emission spectroscopy (SS-OES) for quick quantitative evaluation.

Microstructural quantification, on the other hand, can be done using electron backscattered diffraction (EBSD).

When more information is required on the mechanical properties of the material, Vickers and Brinell hardness testing can be performed as well as tensile testing.

Other material inquiries

The Sustainable Materials Science group possesses a ‘SME e-wallet’ (Kmo-portefeuille) profile, which allows entrepreneurs to get financial aid when contracting with us. More information

Is your material issue or investigation more complex, or do you have further questions regarding our expertise and what we can do for you? contact our experts