Basic instruments:

PhysTech Fourier Transform DLTS equipped with liquid He/liquid N2 crystats (4-600K) and Leybold temperature controller.

Agilent fast pulse generator (pulse length >1 ns) for fast electrical filling pulses.

Laser diodes (900 nm and 1500 nm) for optical filling pulses.

Measurement modes:

DLTS: classical capacitance DLTS using electrical pulse

CC-DLTS: constant capacitance DLTS

ODLTS: capacitance DLTS using optical pulse

CDLTS: current DLTS using optical or electrical pulse

QDLTS: charge DLTS

Selection of recent papers

“Deep Levels in W-Doped Czochralski Silicon”
E. Simoen, K. Saga, H. Vrielinck, J. Lauwaert
ECS Journal of Solid State Science and Technology. 5 P3001-P3007 (2016)

“Electronic properties of manganese impurities in germanium”
J. Lauwaert, S. Segers, F. Moens, K. Opsomer, P. Clauws, F. Callens, E. Simoen, H. Vrielinck
Journal of Physics D-Applied Physics 48. Article no. 175101 (2015)

“Modeling of capacitance transients of thin-film solar cells: a valuable tool to gain information on perturbing layers or interfaces”
J. Lauwaert, J. Lauwaert, L. Van Puyvelde, J. Thybaut, H. Vrielinck
Applied Physics Letters. 104(5), article no. 053502 (2014)