Doctoral Schools on High-resolution X-ray Computed Tomography


This week, we hosted the third edition of our Doctoral Schools on "High-resolution X-ray Computed Tomography: a guide to image acquisition, visualization and analysis". We were delighted to welcome a large group of enthusiastic researchers from all around the world, and we would like to thank our guest lecturers Joost Batenburg (Universiteit Leiden / CWI Amsterdam), Jan Dewanckele and Denis Van Loo (both TESCAN-XRE).

Doctoral Schools 2019Doctoral Schools 2019