Special issue in the journal Materials


We are happy to announce our Special Issue in the journal Materials (Impact Factor 2017: 2.728) entitled "Novel Acquisition and Analysis Methods for X-ray Micro-CT in Materials Sciences". The Guest editors for this issue are Prof. Matthieu Boone and Prof. Veerle Cnudde.

In recent years, micro-CT has evolved drastically, both in lab environments, such as at synchrotron facilities, and in terms of data acquisition, as well as data analysis. With this Special Issue, the goal is to create an overview of these recent developments applied on materials research. The focus is on the methodological perspective of any of the aspects of X-ray micro-CT imaging illustrated with an example in materials sciences, as well as on novel applications of recent innovations in micro-CT imaging.

Topics may include:

  • X-ray phase contrast and/or dark-field imaging
  • Spectral and hyperspectral X-ray micro-CT
  • Dual-energy X-ray imaging
  • High-speed or dynamic X-ray micro-CT
  • In-situ or operando X-ray imaging
  • Micro-CT at novel X-ray sources
  • 3D analysis
  • Digital volume correlation
  • Conversion to numerical models.

For more information on this special issue, please visit the dedicated webpage.

The deadline of submission is January 31, 2020. You may send your manuscript anytime until the deadline. We also encourage authors to inform us about potential submissions as soon as possible. Please note that earlier submissions are published earlier.

If you have any further questions, please do not hesitate to contact us or Ms. Andi Huang, the Section Managing Editor of the Materials Editorial Office ().