Services

Plasma sources

• For fundamental and/or engineering purposes
  • Contact Prof. dr. ir. Christophe Leys (Christophe.Leys@UGent.be)
• For application purposes
  • Contact Prof. dr. Rino Morent (Rino.Morent@UGent.be)
• For spectroscopic techniques like OES, LIF and MS
  • Contact Dr. Anton Nikiforov (Anton.Nikiforov@UGent.be)

Surface analysis

The research group offers several surface characterization techniques to universities and industry.

Types of analysis:

• Contact angle measurements
• X-ray Photo-electron Spectroscopy (XPS)
• Fourier Transform Infrared Spectroscopy (FT-IR)
• AFM
• SEM

Surface analysis request form
Please return the completed form to Prof. ir. Rino Morent (Rino.Morent@UGent.be)